Tokyo
Japan
26
2025-05-01
The entities that hold a legal rights for patent applications filed by inventor MAN Xin:
Xin MAN from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
MACHINING METHOD AND CHARGED PARTICLE BEAM DEVICE
#2 | 2024-11-14CONTROL METHOD, CHARGED PARTICLE BEAM DEVICE, AND PROGRAM
#3 | 2021-09-23METHOD FOR OBSERVING BIOLOGICAL TISSUE SAMPLE
#4 | 2021-03-25Charged particle beam irradiation apparatus and control method
#5 | 2021-03-25Particle beam irradiation apparatus
#6 | 2020-04-09Cross-section observation device, and control method
#7 | 2019-09-12Apparatus, method, and program for processing and observing cross section, and method of measuring shape
#8 | 2019-05-30Cross section processing observation method and charged particle beam apparatus
#9 | 2017-09-28Method for cross-section processing and observation and apparatus therefor
#10 | 2016-11-24Cross-section processing-and-observation method and cross-section processing-and-observation apparatus
#11 | 2015-09-17Cross-section processing and observation method and cross-section processing and observation apparatus
#12 | 2015-08-13Crystal analysis apparatus, composite charged particle beam device, and crystal analysis method
#13 | 2015-07-23Charged particle beam apparatus and sample observation method
#14 | 2015-07-23Charged particle beam device, control method for charged particle beam device, and cross-section processing observation apparatus
#15 | 2015-03-05Charged particle beam apparatus
#16 | 2015-03-05Charged particle beam apparatus
#17 | 2015-03-05Cross-section processing-and-observation method and cross-section processing-and-observation apparatus
#18 | 2014-10-02Charged particle beam apparatus and sample processing method using charged particle beam apparatus
#19 | 2014-10-02Focused ion beam apparatus, method for observing cross-section of sample by using the same, and storage medium
#20 | 2014-05-15Cross-section processing and observation method and cross-section processing and observation apparatus
#21 | 2014-03-20Crystal analysis apparatus, composite charged particle beam device, and crystal analysis method
#22 | 2013-09-26Sample preparation method
#23 | 2013-09-26Composite charged particle beam apparatus
#24 | 2013-09-26Cross-section processing and observation method and cross-section processing and observation apparatus
#25 | 2013-09-26Sample observation method, sample preparation method, and charged particle beam apparatus
#26 | 2013-09-19Sample preparation apparatus and sample preparation method
440125 ⎘