Japan
83
2019-06-20
83
2020-04-28
These are the the leading inventors for applications assigned to Hitachi High-Tech Science Corporation:
Hitachi High-Tech Science Corporation based in , JP has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:
Composite beam apparatus
#2 | 2019-06-06 ✅ Patent 10,571,440 granted on 2020-02-25Two-dimensional liquid chromatographic analyzer
#3 | 2018-10-04 ✅ Patent 10,485,087 granted on 2019-11-19Portable information terminal, beam irradiation system, and program
#4 | 2018-10-04 ✅ Patent 10,468,228 granted on 2019-11-05Charged particle beam apparatus
#5 | 2018-09-27 ✅ Patent 10,529,533 granted on 2020-01-07Sample holder, member mounting device, and charged particle beam apparatus
#6 | 2018-09-27 ✅ Patent 10,600,612 granted on 2020-03-24Charged particle beam apparatus
#7 | 2018-09-27 ✅ Patent 10,510,508 granted on 2019-12-17Charged particle beam apparatus
#8 | 2018-08-16 ✅ Patent 10,790,112 granted on 2020-09-29Focused ion beam apparatus
#9 | 2018-07-19 ✅ Patent 10,692,688 granted on 2020-06-23Charged particle beam apparatus
#10 | 2018-06-28 ✅ Patent 10,446,370 granted on 2019-10-15Charged particle beam apparatus and method for controlling charged beam apparatus
#11 | 2018-03-15 ✅ Patent 10,204,759 granted on 2019-02-12Composite beam apparatus
#12 | 2017-09-28 ✅ Patent 10,242,842 granted on 2019-03-26Method for cross-section processing and observation and apparatus therefor
#13 | 2017-09-28 ✅ Patent 9,947,506 granted on 2018-04-17Sample holder and focused ion beam apparatus
#14 | 2017-09-28 ✅ Patent 10,658,147 granted on 2020-05-19Charged particle beam apparatus
#15 | 2017-09-28 ✅ Patent 10,801,977 granted on 2020-10-13Radiation analyzing apparatus and radiation analyzing method
#16 | 2017-09-21 ✅ Patent 10,056,227 granted on 2018-08-21Focused ion beam apparatus
#17 | 2017-06-22 ✅ Patent 10,236,159 granted on 2019-03-19Charged particle beam apparatus
#18 | 2017-03-30 ✅ Patent 10,014,157 granted on 2018-07-03Method for acquiring image and ion beam apparatus
#19 | 2017-03-30 ✅ Patent 10,186,398 granted on 2019-01-22Sample positioning method and charged particle beam apparatus
#20 | 2017-03-09 ✅ Patent 10,176,964 granted on 2019-01-08Focused ion beam apparatus
#21 | 2016-12-22 ✅ Patent 10,014,155 granted on 2018-07-03Microsample stage and method of manufacturing the same
#22 | 2016-11-24 ✅ Patent 10,096,449 granted on 2018-10-09Cross-section processing-and-observation method and cross-section processing-and-observation apparatus
#23 | 2016-08-25 ✅ Patent 9,679,743 granted on 2017-06-13Sample processing evaluation apparatus
#24 | 2016-08-11 ✅ Patent 9,678,218 granted on 2017-06-13Radiation analyzing apparatus
#25 | 2016-08-11 ✅ Patent 10,048,216 granted on 2018-08-14X-ray analyzer
#26 | 2016-08-04 ✅ Patent 9,793,085 granted on 2017-10-17Focused ion beam apparatus
#27 | 2016-08-04 ✅ Patent 9,885,639 granted on 2018-02-06Sample carrying device and vacuum apparatus
#28 | 2016-07-21 ✅ Patent 9,678,227 granted on 2017-06-13Radiation analyzing apparatus
#29 | 2016-06-09 ✅ Patent 9,810,649 granted on 2017-11-07X-ray fluorescence analyzer
#30 | 2016-03-31 ✅ Patent 9,741,535 granted on 2017-08-22Charged particle beam apparatus
#31 | 2016-03-31 ✅ Patent 10,312,051 granted on 2019-06-04Composite charged particle beam apparatus
#32 | 2016-03-03 ✅ Patent 9,620,333 granted on 2017-04-11Charged particle beam apparatus
#33 | 2016-03-03 ✅ Patent 9,829,447 granted on 2017-11-28X-ray fluorescence analyzer and method of displaying sample thereof
#34 | 2015-12-10 ✅ Patent 9,640,361 granted on 2017-05-02Emitter structure, gas ion source and focused ion beam system
#35 | 2015-09-24 ✅ Patent 9,269,539 granted on 2016-02-23Focused ion beam apparatus
#36 | 2015-09-24 ✅ Patent 9,455,119 granted on 2016-09-27Charged particle beam apparatus
#37 | 2015-09-17 ✅ Patent 9,966,226 granted on 2018-05-08Cross-section processing and observation method and cross-section processing and observation apparatus
#38 | 2015-08-13 ✅ Patent 9,218,937 granted on 2015-12-22Charged particle beam apparatus having improved needle movement control
#39 | 2015-08-13 ✅ Patent 9,275,827 granted on 2016-03-01Charged particle beam apparatus having needle probe that tracks target position changes
#40 | 2015-08-13 ✅ Patent 9,470,642 granted on 2016-10-18Crystal analysis apparatus, composite charged particle beam device, and crystal analysis method
#41 | 2015-08-06 ✅ Patent 9,336,987 granted on 2016-05-10Charged particle beam apparatus
#42 | 2015-07-23 ✅ Patent 9,793,092 granted on 2017-10-17Charged particle beam apparatus and processing method
#43 | 2015-07-23 ✅ Patent 9,384,941 granted on 2016-07-05Charged particle beam apparatus and sample observation method
#44 | 2015-07-23 ✅ Patent 9,368,323 granted on 2016-06-14Charged particle beam device, control method for charged particle beam device, and cross-section processing observation apparatus
#45 | 2015-06-25 ✅ Patent 9,645,100 granted on 2017-05-09X-ray fluorescence analysis apparatus
#46 | 2015-06-11 ✅ Patent 9,336,979 granted on 2016-05-10Focused ion beam apparatus with precious metal emitter surface
#47 | 2015-04-30 ✅ Patent 9,548,185 granted on 2017-01-17Cross section processing method and cross section processing apparatus
#48 | 2015-03-05 ✅ Patent 9,318,303 granted on 2016-04-19Charged particle beam apparatus
#49 | 2015-03-05 ✅ Patent 9,245,713 granted on 2016-01-26Charged particle beam apparatus
#50 | 2015-03-05 ✅ Patent 9,347,896 granted on 2016-05-24Cross-section processing-and-observation method and cross-section processing-and-observation apparatus
#51 | 2014-10-02 ✅ Patent 9,418,817 granted on 2016-08-16Focused ion beam apparatus and control method thereof
#52 | 2014-10-02 ✅ Patent 9,129,771 granted on 2015-09-08Emitter structure, gas ion source and focused ion beam system
#53 | 2014-10-02 ✅ Patent 9,310,325 granted on 2016-04-12Focused ion beam apparatus and method of working sample using the same
#54 | 2014-10-02 ✅ Patent 9,202,671 granted on 2015-12-01Charged particle beam apparatus and sample processing method using charged particle beam apparatus
#55 | 2014-10-02 ✅ Patent 8,890,093 granted on 2014-11-18Charged particle beam apparatus and method for forming observation image
#56 | 2014-10-02 ✅ Patent 9,934,938 granted on 2018-04-03Focused ion beam apparatus, method for observing cross-section of sample by using the same, and storage medium
#57 | 2014-09-25 ✅ Patent 9,245,712 granted on 2016-01-26Focused ion beam system
#58 | 2014-09-25 ✅ Patent 9,218,939 granted on 2015-12-22Focused ion beam system, sample processing method using the same, and sample processing program using focused ion beam
#59 | 2014-09-04 ✅ Patent 8,999,178 granted on 2015-04-07Method for fabricating emitter
#60 | 2014-05-15 ✅ Patent 9,080,945 granted on 2015-07-14Cross-section processing and observation method and cross-section processing and observation apparatus
#61 | 2014-03-20 ✅ Patent 9,046,472 granted on 2015-06-02Crystal analysis apparatus, composite charged particle beam device, and crystal analysis method
#62 | 2014-03-06 ✅ Patent 9,190,243 granted on 2015-11-17Composite charged particle beam apparatus and thin sample processing method
#63 | 2014-02-20 ✅ Patent 9,229,114 granted on 2016-01-05Radiation analyzer and method for analyzing radiation
#64 | 2013-09-26 ✅ Patent 9,260,782 granted on 2016-02-16Sample preparation method
#65 | 2013-09-26 ✅ Patent 8,642,980 granted on 2014-02-04Composite charged particle beam apparatus
#66 | 2013-09-26 ✅ Patent 9,111,717 granted on 2015-08-18Ion beam apparatus
#67 | 2013-09-26 ✅ Patent 8,637,819 granted on 2014-01-28Cross-section processing and observation apparatus
#68 | 2013-09-26 ✅ Patent 8,853,629 granted on 2014-10-07Cross-section processing and observation method and cross-section processing and observation apparatus
#69 | 2013-09-26 ✅ Patent 9,287,087 granted on 2016-03-15Sample observation method, sample preparation method, and charged particle beam apparatus
#70 | 2013-09-26 ✅ Patent 8,764,994 granted on 2014-07-01Method for fabricating emitter
#71 | 2013-09-19 ✅ Patent 8,803,111 granted on 2014-08-12Sample preparation apparatus and sample preparation method
#72 | 2013-09-19 ✅ Patent 8,674,324 granted on 2014-03-18Charged particle beam apparatus and sample transporting apparatus
#73 | 2013-09-19 ✅ Patent 8,822,911 granted on 2014-09-02Focused ion beam apparatus and method of adjusting ion beam optics
#74 | 2013-08-29 ✅ Patent 9,257,273 granted on 2016-02-09Charged particle beam apparatus, thin film forming method, defect correction method and device forming method
#75 | 2013-08-22 ✅ Patent 8,916,839 granted on 2014-12-23Sample preparation method and apparatus
#76 | 2013-08-15 ✅ Patent 9,315,898 granted on 2016-04-19TEM sample preparation method
#77 | 2013-07-11 ✅ Patent 8,621,660 granted on 2013-12-31Probe shape evaluation method for a scanning probe microscope
#78 | 2013-07-11 ✅ Patent 9,595,420 granted on 2017-03-14Method for preparing lamella
#79 | 2013-04-25 ✅ Patent 8,963,100 granted on 2015-02-24Nitrogen ions from a gas field ion source held at a pressure of 1.0 x 10^(-6) pa to 1.0 x 10^(-2) pa
#80 | 2013-04-04 ✅ Patent 9,214,316 granted on 2015-12-15Composite charged particle beam apparatus
#81 | 2013-03-28 ✅ Patent 9,024,280 granted on 2015-05-05Composite charged particle beam apparatus
#82 | 2012-12-27 ✅ Patent 8,815,474 granted on 2014-08-26Photomask defect correcting method and device
#83 | 2007-12-20 ✅ Patent 8,859,279 granted on 2014-10-14Cell detachment method
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