Dirk-Oliver Fehrer

City:

Oftersheim

Country:

Germany

Published Applications:

Last publication date:

2007-11-01

Top Assignees for applications by Dirk-Oliver Fehrer

The entities that hold a legal rights for patent applications filed by inventor Fehrer Dirk-Oliver:

LEICA MICROSYSTEMS CMS GMBH 2 Wetzlar, Germany

Recent patent applications by Fehrer Dirk-Oliver

Dirk-Oliver Fehrer from Oftersheim, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2007-11-01

US20070252499A1

Physics

Scanning microscope

#2 | 2007-07-26

US20070171502A1

Physics

Beam deflector and scanning microscope

InventorID:

4457765 ⎘