Jae Chol JOO

City:

Suwon-si

Country:

South Korea

Published Applications:

Last publication date:

2018-05-24

Top Assignees for applications by Jae Chol JOO

The entities that hold a legal rights for patent applications filed by inventor JOO Jae Chol:

Jae Chol JOO from Suwon-si, KR has applied for patents for these inventions. The list has both pending applications and granted patents:

OPTICAL INSPECTION APPARATUS AND METHOD AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING THE APPARATUS

Wafer inspection apparatus and wafer inspection method using the same

Method of inspecting surface having a minute pattern based on detecting light reflected from metal layer on the surface

POSITION MEASURING SYSTEM AND METHOD

InventorID:

449644 ⎘