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Inventor profile of:

Lu Chen

City:

Sunnyvale, California

Country:

United States

Published Applications:

Last publication date:

2025-10-02

Top Assignees for applications by Lu Chen

The entities that hold a legal rights for patent applications filed by inventor Chen Lu:

KLA-Tencor Corp. 4 San Jose, CA United States
KLA-Tencor Corporation 3 San Jose, CA United States
KLA-Tencor Corp. 1 Milpitas, CA United States
KLA-Tencor Corporation 1 Milpitas, CA United States
Microsoft Technology Licensing, LLC 1 Redmond, WA United States

Recent patent applications by Chen Lu

Lu Chen from Sunnyvale, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-10-02

US20250307688A1

Physics

ACTION SEQUENCE GENERATION FOR REAL-TIME EVENTS USING A UNIFIED SCHEMA

#2 | 2025-06-26

US20250209545A1

Physics

GENERATING USER PROFILE SUMMARIES BASED ON VIEWER INTENT

#3 | 2025-01-02

US20250005346A1

Physics

USER INTENT LEARNING WITH SESSION SEQUENCE DATA

#4 | 2024-12-12

US20240411573A1

Physics

MACHINE LEARNING FOR PREDICTING NEXT BEST ACTION

#5 | 2020-07-16

US20200226694A1

Physics

REDUCING SUPPLY-DEMAND GAP

#6 | 2020-06-25

US20200201870A1

Physics

CONTENT CREATOR MESSAGING FRAMEWORK

#7 | 2018-07-19

US20180202943A1

Physics

Systems and methods for detecting defects on a wafer

#8 | 2013-09-26

US20130250287A1

Physics

Systems and methods for detecting defects on a wafer

#9 | 2012-10-25

US20120268735A1

Physics

Systems and methods for detecting defects on a wafer

#10 | 2012-09-20

US20120235116A1

Electricity

LIGHT EMITTING DIODE WITH ENHANCED QUANTUM EFFICIENCY AND METHOD OF FABRICATION

#11 | 2012-02-23

US20120044486A1

Physics

Detecting defects on a wafer

#12 | 2011-10-27

US20110263111A1

Electricity

GROUP III-NITRIDE N-TYPE DOPING

#13 | 2010-07-29

US20100188657A1

Physics

Systems and methods for detecting defects on a wafer

InventorID:

453393 ⎘