Livermore, California
United States
13
2019-01-03
The entities that hold a legal rights for patent applications filed by inventor Mahadevan Mohan:
Mohan Mahadevan from Livermore, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Generating high resolution images from low resolution images for semiconductor applications
#2 | 2018-11-15Learning based approach for aligning images acquired with different modalities
#3 | 2018-10-11Contour based defect detection
#4 | 2018-07-19Systems and methods for detecting defects on a wafer
#5 | 2017-07-13Accelerating semiconductor-related computations using learning based models
#6 | 2017-07-06Accelerated training of a machine learning based model for semiconductor applications
#7 | 2015-12-24Automated inline inspection of wafer edge strain profiles using rapid photoreflectance spectroscopy
#8 | 2015-08-20Wafer and lot based hierarchical method combining customized metrics with a global classification methodology to monitor process tool condition at extremely high throughput
#9 | 2013-09-26Systems and methods for detecting defects on a wafer
#10 | 2012-10-25Systems and methods for detecting defects on a wafer
#11 | 2012-05-10Data perturbation for wafer inspection or metrology setup using a model of a difference
#12 | 2010-07-29Systems and methods for detecting defects on a wafer
#13 | 2009-03-26Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions
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