Inventor profile of:

Mohan Mahadevan

City:

Livermore, California

Country:

United States

Published Applications:

13

Last publication date:

2019-01-03

Top Assignees for applications by Mohan Mahadevan

The entities that hold a legal rights for patent applications filed by inventor Mahadevan Mohan:

Recent patent applications by Mahadevan Mohan

Mohan Mahadevan from Livermore, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2019-01-03
US20190005629A1
Physics

Generating high resolution images from low resolution images for semiconductor applications

#2 | 2018-11-15
US20180330511A1
Physics

Learning based approach for aligning images acquired with different modalities

#3 | 2018-10-11
US20180293721A1
Physics

Contour based defect detection

#4 | 2018-07-19
US20180202943A1
Physics

Systems and methods for detecting defects on a wafer

#5 | 2017-07-13
US20170200260A1
Physics

Accelerating semiconductor-related computations using learning based models

#6 | 2017-07-06
US20170193400A1
Physics

Accelerated training of a machine learning based model for semiconductor applications

#7 | 2015-12-24
US20150371910A1
Electricity

Automated inline inspection of wafer edge strain profiles using rapid photoreflectance spectroscopy

#8 | 2015-08-20
US20150234379A1
Physics

Wafer and lot based hierarchical method combining customized metrics with a global classification methodology to monitor process tool condition at extremely high throughput

#9 | 2013-09-26
US20130250287A1
Physics

Systems and methods for detecting defects on a wafer

#10 | 2012-10-25
US20120268735A1
Physics

Systems and methods for detecting defects on a wafer

#11 | 2012-05-10
US20120116733A1
Physics

Data perturbation for wafer inspection or metrology setup using a model of a difference

#12 | 2010-07-29
US20100188657A1
Physics

Systems and methods for detecting defects on a wafer

#13 | 2009-03-26
US20090080759A1
Physics

Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions

InventorID:

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