Inventor profile of:

Thorsten Bucksch

City:

Munchen

Country:

Germany

Published Applications:

16

Last publication date:

2026-03-26

Top Assignees for applications by Thorsten Bucksch

The entities that hold a legal rights for patent applications filed by inventor Bucksch Thorsten:

Recent patent applications by Bucksch Thorsten

Thorsten Bucksch from Munchen, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-03-26
US20260088739A1
Electricity

SHUNTLESS MOTOR CONTROL

#2 | 2006-11-09
US20060253756A1
Physics

Semi-conductor component test device with shift register, and semi-conductor component test procedure

#3 | 2006-07-13
US20060156081A1
Physics

Semiconductor component test procedure, as well as a data buffer component

#4 | 2006-06-15
US20060126408A1
Physics

Memory buffer

#5 | 2006-06-08
US20060120139A1
Physics

Inputting and outputting operating parameters for an integrated semiconductor memory device

#6 | 2006-05-18
US20060107155A1
Physics

Semi-conductor component test device, in particular data buffer component with semi-conductor component test device, as well as semi-conductor component test procedure

#7 | 2006-04-27
US20060087900A1
Physics

Semi-conductor component, as well as a process for the in-or output of test data

#8 | 2006-01-05
US20060005089A1
Physics

Device and a process for the calibration of a semiconductor component test system

#9 | 2005-12-08
US20050273679A1
Physics

Semi-conductor component test procedure, in particular for a system with several modules, each comprising a data buffer component, as well as a test module to be used in a corresponding procedure

#10 | 2005-11-17
US20050254324A1
Physics

Semi-conductor component test procedure, as well as a data buffer component

#11 | 2005-09-15
US20050200372A1
Physics

Contact plate for use in standardizing tester channels of a tester system and a standardization system having such a contact plate

#12 | 2005-07-28
US20050162176A1
Physics

Test device for wafer testing digital semiconductor circuits

#13 | 2005-05-24
US10151989
-

Method and device for testing a memory circuit

#14 | 2005-05-05
US20050093564A1
Physics

Signal test procedure for testing semi-conductor components and a test apparatus for testing semi-conductor components

#15 | 2005-03-03
US20050046436A1
Physics

Calibration device for the calibration of a tester channel of a tester device and a test system

#16 | 2005-02-03
US20050024059A1
Physics

Apparatus and method for calibrating a semiconductor test system

InventorID:

4547805 ⎘