Yossi Simon

City:

Milpitas, California

Country:

United States

Published Applications:

Last publication date:

2024-03-21

Top Assignees for applications by Yossi Simon

The entities that hold a legal rights for patent applications filed by inventor Simon Yossi:

Yossi Simon from Milpitas, US has applied for patents for these inventions. The list has both pending applications and granted patents:

HIGH-RESOLUTION EVALUATION OF OPTICAL METROLOGY TARGETS FOR PROCESS CONTROL

System and method for determining target feature focus in image-based overlay metrology

Massive overlay metrology sampling with multiple measurement columns

System and method for determining target feature focus in image-based overlay metrology

Sensitive optical metrology in scanning and static modes

InventorID:

5042317 ⎘