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Inventor profile of:

Yiwei CHEN

City:

Beijing

Country:

China

Published Applications:

Last publication date:

2026-05-14

Top Assignees for applications by Yiwei CHEN

The entities that hold a legal rights for patent applications filed by inventor CHEN Yiwei:

SAMSUNG ELECTRONICS CO., LTD. 13 Suwon-si, South Korea

Recent patent applications by CHEN Yiwei

Yiwei CHEN from Beijing, CN has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-05-14

US20260134253A1

Physics

DEVICE AND METHOD WITH AUTONOMOUS DRIVING USING ARTIFICIAL INTELLIGENCE

#2 | 2026-01-15

US20260017805A1

Physics

METHOD AND APPARATUS WITH OBJECT TRACKING USING DYNAMIC FIELD OF VIEW

#3 | 2026-01-08

US20260011112A1

Physics

DEVICE AND METHOD WITH POINT CLOUD DATA PROCESSING

#4 | 2025-06-19

US20250200712A1

Physics

APPARATUS AND METHOD WITH IMAGE PROCESSING

#5 | 2025-06-12

US20250191223A1

Physics

ELECTRONIC DEVICE AND METHOD WITH VOXEL AND KEY POINT DETERMINATION

#6 | 2024-03-28

US20240104410A1

Physics

METHOD AND DEVICE WITH CASCADED ITERATIVE PROCESSING OF DATA

#7 | 2024-02-08

US20240046486A1

Physics

METHOD AND APPARATUS WITH OBJECT TRACKING

#8 | 2023-06-22

US20230196589A1

Physics

METHOD AND APPARATUS WITH TARGET TRACKING

#9 | 2023-06-15

US20230186492A1

Physics

APPARATUS AND METHOD WITH IMAGE PROCESSING AND TARGET TRACKING

#10 | 2022-06-09

US20220180633A1

Physics

Video object detection and tracking method and apparatus

#11 | 2022-06-09

US20220180531A1

Physics

METHOD AND APPARATUS WITH OBJECT TRACKING USING DYNAMIC FIELD OF VIEW

#12 | 2021-07-22

US20210225018A1

Physics

Depth estimation method and apparatus

#13 | 2021-07-22

US20210224564A1

Physics

Method and apparatus for tracking target

InventorID:

5143123 ⎘