Gilad Laredo

City:

Haifa

Country:

Israel

Published Applications:

Last publication date:

2024-01-25

Top Assignees for applications by Gilad Laredo

The entities that hold a legal rights for patent applications filed by inventor Laredo Gilad:

Gilad Laredo from Haifa, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

MASSIVE OVERLAY METROLOGY SAMPLING WITH MULTIPLE MEASUREMENT COLUMNS

Massive overlay metrology sampling with multiple measurement columns

Adaptive focusing system for a scanning metrology tool

Imaging system for buried metrology targets

Measurement modes for overlay

METROLOGY TARGET FOR SCANNING METROLOGY

InventorID:

5209892 ⎘