Jongmin Yoon

City:

Incheon

Country:

South Korea

Published Applications:

Last publication date:

2023-06-29

Top Assignees for applications by Jongmin Yoon

The entities that hold a legal rights for patent applications filed by inventor Yoon Jongmin:

Jongmin Yoon from Incheon, KR has applied for patents for these inventions. The list has both pending applications and granted patents:

Inspection apparatus and method of inspecting wafer

Inspection apparatus and inspection method using same

Probe for detecting near field and near-field detection system including the same

Hybrid probe, physical property analysis apparatus including the same, and method of measuring semiconductor device using the apparatus

INSPECTION APPARATUS OF WAFER

InventorID:

5251933 ⎘