Gilroy, California
United States
9
2025-12-25
The entities that hold a legal rights for patent applications filed by inventor Erickson Blake W.:
Blake W. Erickson from Gilroy, US has applied for patents for these inventions. The list has both pending applications and granted patents:
IMPLEMENTING FEATURES GENERATED USING DISCRETE EFFECTIVE MEDIUM REFRACTIVE ANALYSIS OF PATTERNED SUBSTRATES
#2 | 2024-12-26LOW OPEN AREA AND COUPON ENDPOINT DETECTION
#3 | 2024-12-19LOW OPEN AREA AND COUPON ENDPOINT DETECTION
#4 | 2024-10-31TRANSMISSION CORRECTED PLASMA EMISSION USING IN-SITU OPTICAL REFLECTOMETRY
#5 | 2024-08-29THIN FILM, IN-SITU MEASUREMENT THROUGH TRANSPARENT CRYSTAL AND TRANSPARENT SUBSTRATE WITHIN PROCESSING CHAMBER WALL
#6 | 2023-09-21PROCESS CHARACTERIZATION AND CORRECTION USING OPTICAL WALL PROCESS SENSOR (OWPS)
#7 | 2023-03-16Transmission corrected plasma emission using in-situ optical reflectometry
#8 | 2022-01-20Low open area and coupon endpoint detection
#9 | 2021-12-16Thin film, in-situ measurement through transparent crystal and transparent substrate within processing chamber wall
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