Eindhoven
Netherlands
11
2025-07-31
The entities that hold a legal rights for patent applications filed by inventor REN Yan:
Yan REN from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:
METHOD OF FILTERING FALSE POSITIVES FOR A PIXELATED ELECTRON DETECTOR
#2 | 2024-10-10CHARGED-PARTICLE OPTICAL APPARATUS AND PROJECTION METHOD
#3 | 2024-10-10CHARGED PARTICLE DEVICE, CHARGED PARTICLE ASSESSMENT APPARATUS, MEASURING METHOD, AND MONITORING METHOD
#4 | 2024-10-03CHARGED-PARTICLE APPARATUS, MULTI-DEVICE APPARATUS, METHOD OF USING CHARGED-PARTICLE APPARATUS AND CONTROL METHOD
#5 | 2023-10-12CHARGED PARTICLE TOOL, CALIBRATION METHOD, INSPECTION METHOD
#6 | 2023-05-18Systems and methods for real time stereo imaging using multiple electron beams
#7 | 2023-05-18Pulsed charged-particle beam system
#8 | 2023-02-16APPARATUS FOR AND METHOD OF CONTROL OF A CHARGED PARTICLE BEAM
#9 | 2023-01-26Systems and methods for chromatic aberration mitigation
#10 | 2022-05-12Apparatus for and method of controlling an energy spread of a charged-particle beam
#11 | 2022-03-03Apparatus for multiple charged-particle beams
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