Bappaditya Dey

City:

Heverlee

Country:

Belgium

Published Applications:

Last publication date:

2026-05-07

Top Assignees for applications by Bappaditya Dey

The entities that hold a legal rights for patent applications filed by inventor Dey Bappaditya:

Bappaditya Dey from Heverlee, BE has applied for patents for these inventions. The list has both pending applications and granted patents:

Generative Approach for Images Towards Advanced Node Defect Inspection

Reinforcement Learning (RL) Based Federated Automated Defect Classification and Detection

Reinforcement Learning (RL) Based Federated Automated Defect Classification and Detection

AUTOMATED DEFECT CLASSIFICATION AND DETECTION

WAFER IMAGE DENOISING AND CONTOUR EXTRACTION FOR MANUFACTURING PROCESS CALIBRATION

Method for de-noising an electron microscope image

InventorID:

5347871 ⎘