Yuri Paskover

City:

Milpitas, California

Country:

United States

Published Applications:

Last publication date:

2023-12-26

Top Assignees for applications by Yuri Paskover

The entities that hold a legal rights for patent applications filed by inventor Paskover Yuri:

Yuri Paskover from Milpitas, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Systems and methods for metrology with layer-specific illumination spectra

SYSTEM AND METHOD FOR ISOLATION OF SPECIFIC FOURIER PUPIL FREQUENCY IN OVERLAY METROLOGY

SCANNING SCATTEROMETRY OVERLAY METROLOGY

Moiré scatterometry overlay

On-the-fly scatterometry overlay metrology target

InventorID:

5435694 ⎘