Thierry Parrassin

City:

Grenoble

Country:

France

Published Applications:

Last publication date:

2015-10-15

Top Assignees for applications by Thierry Parrassin

The entities that hold a legal rights for patent applications filed by inventor Parrassin Thierry:

Thierry Parrassin from Grenoble, FR has applied for patents for these inventions. The list has both pending applications and granted patents:

Spectral mapping of photo emission

Defect detection by thermal frequency imaging

Test structure for integrated electronic circuits

Focused ion beam treatment method and semiconductor device suitable for its implementation

InventorID:

5469 ⎘