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Assignee profile:

FEI EFA, Inc.

City:

Fremont, California

Country:

United States

Published Applications:

17

Last publication date:

2020-04-16

Patent Grants:

17

Last grant date:

2021-06-01

Top Inventors for applications by FEI EFA, Inc.

These are the the leading inventors for applications assigned to FEI EFA, Inc.:

Recent patent applications by FEI EFA, Inc.

FEI EFA, Inc. based in Fremont, US has been assigned the rights to these inventions. The list includes both Pending Applications and Patent Grants:

#1 | 2020-04-16 ✅ Patent 11,022,646 granted on 2021-06-01
US20200116782A1
Physics

Method and system for resolving hot spots in LIT

 #2 | 2020-01-23 ✅ Patent 11,353,479 granted on 2022-06-07
US20200025799A1
Physics

Laser-assisted device alteration using synchronized laser pulses

 #3 | 2019-05-23 ✅ Patent 10,718,933 granted on 2020-07-21
US20190155013A1
Physics

Self correcting floating SIL tip

 #4 | 2018-11-15 ✅ Patent 10,620,263 granted on 2020-04-14
US20180328985A1
Physics

System and method for fault isolation by emission spectra analysis

 #5 | 2017-03-23 ✅ Patent 9,891,280 granted on 2018-02-13
US20170082685A1
Physics

Probe-based data collection system with adaptive mode of probing controlled by local sample properties

 #6 | 2016-08-25 ✅ Patent 10,545,186 granted on 2020-01-28
US20160245860A1
Physics

Method and system for resolving hot spots in LIT

 #7 | 2016-07-14 ✅ Patent 10,209,274 granted on 2019-02-19
US20160202313A1
Physics

Laser-assisted device alteration using synchronized laser pulses

 #8 | 2016-05-12 ✅ Patent 9,915,700 granted on 2018-03-13
US20160131703A1
Physics

System and method for modulation mapping

 #9 | 2016-04-21 ✅ Patent 10,126,360 granted on 2018-11-13
US20160109513A1
Physics

Systems and method for laser voltage imaging

 #10 | 2015-12-31 ✅ Patent 10,539,589 granted on 2020-01-21
US20150377921A1
Physics

Through process flow intra-chip and inter-chip electrical analysis and process control using in-line nanoprobing

 #11 | 2015-11-26 ✅ Patent 9,905,014 granted on 2018-02-27
US20150339830A1
Physics

Method and system for the examination of a sample by means of thermography

 #12 | 2015-10-15 ✅ Patent 9,903,824 granted on 2018-02-27
US20150293037A1
Physics

Spectral mapping of photo emission

 #13 | 2015-09-17 ✅ Patent 10,133,051 granted on 2018-11-20
US20150260976A1
Physics

Self correcting floating SIL tip

 #14 | 2015-09-17 ✅ Patent 10,041,997 granted on 2018-08-07
US20150260789A1
Physics

System and method for fault isolation by emission spectra analysis

 #15 | 2015-04-02 ✅ Patent 9,817,060 granted on 2017-11-14
US20150091602A1
Physics

Optimized wavelength photon emission microscope for VLSI devices

 #16 | 2014-11-06 ✅ Patent 9,816,866 granted on 2017-11-14
US20140328370A1
Physics

Method for examination of a sample by means of the heat flow thermography

 #17 | 2014-10-16 ✅ Patent 9,885,878 granted on 2018-02-06
US20140307311A1
Physics

Apparatus and method for annular optical power management

Also check out FEI EFA, Inc.'s (Fremont, United States) applicant profile with 13 patent applications submitted.

AssigneeID:

141835 ⎘