Todd Jonathan Egan

City:

Fremont, California

Country:

United States

Published Applications:

Last publication date:

2025-05-22

Top Assignees for applications by Todd Jonathan Egan

The entities that hold a legal rights for patent applications filed by inventor Egan Todd Jonathan:

Todd Jonathan Egan from Fremont, US has applied for patents for these inventions. The list has both pending applications and granted patents:

SURFACE ROUGHNESS AND EMISSIVITY DETERMINATION

SPATIAL PATTERN LOADING MEASUREMENT WITH IMAGING METROLOGY

Spatial pattern loading measurement with imaging metrology

InventorID:

5534161 ⎘