Benoit Herve GAURY

City:

Eindhoven

Country:

Netherlands

Published Applications:

Last publication date:

2026-06-04

Top Assignees for applications by Benoit Herve GAURY

The entities that hold a legal rights for patent applications filed by inventor GAURY Benoit Herve:

ASML Netherlands B.V. 9 Veldhoven, Netherlands
ASMLNETHERLANDS B.V. 1 Veldhoven, Netherlands

Recent patent applications by GAURY Benoit Herve

Benoit Herve GAURY from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-06-04

US20260155332A1

Electricity

SYSTEMS AND METHODS FOR PULSED VOLTAGE CONTRAST DETECTION AND CAPTURE OF CHARGING DYNAMICS

#2 | 2025-12-18

US20250385070A1

Electricity

SCANNING ELECTRON MICROSCOPY (SEM) BACK-SCATTERING ELECTRON (BSE) FOCUSED TARGET AND METHOD

#3 | 2025-09-11

US20250284209A1

Physics

METHOD AND SYSTEM OF OVERLAY MEASUREMENT USING CHARGED-PARTICLE INSPECTION APPARATUS

#4 | 2025-07-17

US20250231129A1

Physics

E-BEAM OPTIMIZATION FOR OVERLAY MEASUREMENT OF BURIED FEATURES

#5 | 2024-12-26

US20240427253A1

Physics

OVERLAY MEASUREMENT USING BALANCED CAPACITY TARGETS

#6 | 2023-10-19

US20230335374A1

Electricity

SYSTEMS AND METHODS FOR PULSED VOLTAGE CONTRAST DETECTION AND CAPTURE OF CHARGING DYNAMICS

#7 | 2023-09-21

US20230298852A1

Electricity

DELAY TIME MEASUREMENT METHOD AND SYSTEM

#8 | 2023-07-20

US20230229093A1

Physics

MARK TO BE PROJECTED ON AN OBJECT DURING A LITHOGRAHPIC PROCESS AND METHOD FOR DESIGNING A MARK

#9 | 2023-01-12

US20230009177A1

Physics

Optically determining electrical contact between metallic features in different layers in a structure

InventorID:

5627836 ⎘