EITAN A. ROTHSTEIN

City:

REHOVOT

Country:

Israel

Published Applications:

Last publication date:

2025-04-17

Top Assignees for applications by EITAN A. ROTHSTEIN

The entities that hold a legal rights for patent applications filed by inventor ROTHSTEIN EITAN A.:

EITAN A. ROTHSTEIN from REHOVOT, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

FULL-WAFER METROLOGY UP-SAMPLING

DETECTING OUTLIERS AND ANOMALIES FOR OCD METROLOGY MACHINE LEARNING

Detecting outliers and anomalies for OCD metrology machine learning

InventorID:

5633983 ⎘