Flip de Jong

City:

Leuven

Country:

Belgium

Published Applications:

Last publication date:

2023-02-09

Top Assignees for applications by Flip de Jong

The entities that hold a legal rights for patent applications filed by inventor de Jong Flip:

Flip de Jong from Leuven, BE has applied for patents for these inventions. The list has both pending applications and granted patents:

Photoresist inspection apparatus, photoresist inspection method using the same, and electron beam exposure apparatus

InventorID:

5654707 ⎘