Tokyo
Japan
6
2024-05-23
The entities that hold a legal rights for patent applications filed by inventor Kitayama Shinya:
Shinya Kitayama from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
Charged Particle Beam Device and Sample Analysis Method
#2 | 2021-05-20Composite charged particle beam apparatus
#3 | 2019-08-22Composite charged particle beam apparatus
#4 | 2016-03-31Composite charged particle beam apparatus
#5 | 2014-07-17Charged particle device
#6 | 2013-12-19Ion beam device and machining method
572500 ⎘