Aron J. CEPLER

City:

Armonk, New York

Country:

United States

Published Applications:

Last publication date:

2023-04-27

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Aron J. CEPLER from Armonk, US has applied for patents for these inventions. The list has both pending applications and granted patents:

Measuring local CD uniformity using scatterometry and machine learning

InventorID:

5725460 ⎘