Hui Quan LIM

City:

Eindhoven

Country:

Netherlands

Published Applications:

Last publication date:

2024-06-06

Top Assignees for applications by Hui Quan LIM

The entities that hold a legal rights for patent applications filed by inventor LIM Hui Quan:

Hui Quan LIM from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

METROLOGY TOOL CALIBRATION METHOD AND ASSOCIATED METROLOGY TOOL

A SUBSTRATE COMPRISING A TARGET ARRANGEMENT, AND ASSOCIATED AT LEAST ONE PATTERNING DEVICE, LITHOGRAPHIC METHOD AND METROLOGY METHOD

Substrate comprising a target arrangement, and associated at least one patterning device, lithographic method and metrology method

InventorID:

5762407 ⎘