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Inventor profile of:

Kenji Aoki

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2026-02-05

Top Assignees for applications by Kenji Aoki

The entities that hold a legal rights for patent applications filed by inventor Aoki Kenji:

NEC Corporation 6 Tokyo, Japan
CANON KABUSHIKI KAISHA 3 Tokyo, Japan
SUMCO CORPORATION 2 Tokyo, Japan
NEC CORPORATION 2 Minato-ku, Tokyo, Japan
NIHON MICRO COATING CO., LTD. 2 Tokyo, Japan
HITACHI HIGH-TECHNOLOGIES CORPORATION 1 Tokyo, Japan
JOTO TECHNO CO., LTD. 1 Osaka-shi, Osaka, Japan
HITACHI HIGH-TECH CORPORATION 1 Tokyo, Japan
Hitachi High-Technologies Corporation 1 Minato-ku, TOKYO, Japan

Recent patent applications by Aoki Kenji

Kenji Aoki from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2026-02-05

US20260038803A1

Electricity

BATTERY BASE MATERIAL FOR SECONDARY BATTERY AND METHOD FOR MANUFACTURING SAME

#2 | 2025-10-30

US20250333617A1

Chemistry; metallurgy

RESIN COMPOSITION FOR STEREO-FORMING APPARATUS, FILAMENT FOR STEREO-FORMING APPARATUS, MOLDED OBJECT, AND PELLET FOR STEREO-FORMING APPARATUS

#3 | 2024-12-19

US20240419116A1

Physics

IMAGE FORMING APPARATUS

#4 | 2024-02-01

US20240036504A1

Physics

Image forming apparatus

#5 | 2024-01-04

US20240002182A1

Performing operations; transporting

SHEET CONVEYANCE APPARATUS AND IMAGE FORMING APPARATUS

#6 | 2022-02-03

US20220037112A1

Electricity

Charged particle beam apparatus and sample observation method

#7 | 2018-09-20

US20180268326A1

Physics

OPTIMIZATION SYSTEM, OPTIMIZATION METHOD, AND OPTIMIZATION PROGRAM

#8 | 2016-07-14

US20160203947A1

Electricity

Charged particle beam device and charged particle beam device control method

#9 | 2015-11-26

US20150339364A1

Physics

Visualization device, visualization method and visualization program

#10 | 2015-08-20

US20150235133A1

Physics

DATA CONCENTRATION PREDICTION DEVICE, DATA CONCENTRATION PREDICTION METHOD, AND RECORDING MEDIUM RECORDING PROGRAM THEREOF

#11 | 2015-06-25

US20150179394A1

Electricity

Charged Particle Device

#12 | 2014-08-28

US20140244551A1

Physics

Information spread scale prediction device, information spread scale prediction method, and information spread scale prediction program

#13 | 2014-05-01

US20140122393A1

Physics

Information processing system, network structure learning device, link strength prediction device, link strength prediction method and program

#14 | 2013-12-19

US20130339278A1

Physics

DATA DISCRIMINATION DEVICE, METHOD, AND PROGRAM

#15 | 2012-12-27

US20120331024A1

Physics

Information processing device, method of processing information and storage medium

#16 | 2012-08-16

US20120208439A1

Performing operations; transporting

Method for polishing semiconductor wafer

#17 | 2011-09-22

US20110227786A1

Physics

Abnormal value detection apparatus for satellite positioning system, abnormal value detection method, and abnormal value detection program

#18 | 2011-01-13

US20110005143A1

Electricity

POLISHING OIL SLURRY FOR POLISHING HARD CRYSTAL SUBSTRATE

#19 | 2010-04-08

US20100085561A1

Physics

System and method of two-stepped laser scattering defect inspection

#20 | 2008-06-12

US20080139089A1

Electricity

Method of polishing hard crystal substrate

InventorID:

579938 ⎘