Santa Clara, California
United States
57
2019-01-01
The entities that hold a legal rights for patent applications filed by inventor Yip Aaron:
Aaron Yip from Santa Clara, US has applied for patents for these inventions. The list has both pending applications and granted patents:
3D memory device including shared select gate connections between memory blocks
#2 | 2018-11-15Three dimensional storage cell array with highly dense and scalable word line design approach
#3 | 2017-10-05Three dimensional storage cell array with highly dense and scalable word line design approach
#4 | 2017-06-22Reducing programming disturbance in memory devices
#5 | 2016-07-07Three dimensional memory control circuitry
#6 | 2014-11-27Single check memory devices and methods
#7 | 2014-05-29Three dimensional memory control circuitry
#8 | 2014-04-10Reducing programming disturbance in memory devices
#9 | 2014-01-02Select gate programming in a memory device
#10 | 2012-12-20Erase operation control sequencing apparatus, systems, and methods
#11 | 2012-08-30Programming memory devices
#12 | 2012-06-28Single check memory devices and methods
#13 | 2012-03-22Memory with interleaved read and redundant columns
#14 | 2012-02-23Multi-pass programming in a memory device
#15 | 2011-10-13Select gate programming in a memory device
#16 | 2011-09-29Verifying an erase threshold in a memory device
#17 | 2011-08-04Memory devices and methods of their operation including selective compaction verify operations
#18 | 2011-06-30Method of erasing memory cell
#19 | 2011-01-27Flash memory device with redundant columns
#20 | 2011-01-13Dynamic wordline start voltage for nand programming
#21 | 2010-12-02Method and apparatus for providing a non-volatile memory with reduced cell capacitive coupling
#22 | 2010-11-25Erase operation control sequencing apparatus, systems, and methods
#23 | 2010-08-12Verifying an erase threshold in a memory device
#24 | 2010-06-10Programming memory devices
#25 | 2010-05-27Multi-pass programming in a memory device
#26 | 2010-03-11Memory array segmentation and methods
#27 | 2010-01-28Flash memory device with redundant columns
#28 | 2009-12-17Selective threshold voltage verification and compaction
#29 | 2009-10-01Memory block reallocation in a flash memory device
#30 | 2009-08-27Method for substantially uninterrupted cache readout
#31 | 2009-06-18Programming memory devices
#32 | 2009-06-04Verifying an erase threshold in a memory device
#33 | 2009-02-12Memory device trims
#34 | 2008-10-16Method and apparatus for charging large capacitances
#35 | 2008-07-31Erase operation control sequencing apparatus, systems, and methods
#36 | 2008-06-26Selective threshold voltage verification and compaction
#37 | 2008-06-05Programming memory devices
#38 | 2008-03-27Random cache read
#39 | 2008-01-31Method and apparatus for charging large capacitances
#40 | 2007-12-27Method for substantially uninterrupted cache readout
#41 | 2007-12-13Bitline exclusion in verification operation
#42 | 2007-11-22Method and apparatus for providing a non-volatile memory with reduced cell capacitive coupling
#43 | 2007-08-09Memory array segmentation and methods
#44 | 2007-04-12Memory block reallocation in a flash memory device
#45 | 2007-03-01Programming memory devices
#46 | 2007-03-01Selective threshold voltage verification and compaction
#47 | 2007-02-08Method of comparison between cache and data register for non-volatile memory
#48 | 2006-12-21Bitline exclusion in verification operation
#49 | 2006-11-16Handling defective memory blocks of NAND memory devices
#50 | 2006-11-16Programming memory devices
#51 | 2006-11-02Memory block reallocation in a flash memory device
#52 | 2006-11-02Method of comparison between cache and data register for non-volatile memory
#53 | 2006-11-02Random cache read
#54 | 2006-02-02Non-volatile programmable fuse apparatus in a flash memory with pairs of supercells programmed in a complementary fashion
#55 | 2006-01-19Memory device trims
#56 | 2005-12-29Handling defective memory blocks of NAND memory devices
#57 | 2005-04-12Non-volatile programmable fuse apparatus in a memory device
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