Helmut Puchner

High reliability non-volatile static random access memory devices, methods and systems

SONOS type stacks for nonvolatile charge trap memory devices and methods to form the same

High reliability non-volatile static random access memory devices, methods and systems

Circuit with electrostatic discharge protection

Memory cell array latchup prevention

SONOS type stacks for nonvolatile changetrap memory devices and methods to form the same

Memory controller devices, systems and methods for translating memory requests between first and second formats for high reliability memory devices

Circuit with electrostatic discharge protection

Voltage protection device

Circuit with electrostatic discharge protection

Capacitor triggered silicon controlled rectifier

High voltage diode

Non-volatile memory and method of operating the same

Circuits providing ESD protection to high voltage laterally diffused metal oxide semiconductor (LDMOS) transistors

Drain extended MOS transistor with increased breakdown voltage

Electrostatic discharge protection device

SONOS type stacks for nonvolatile change trap memory devices and methods to form the same

Silicon controlled rectifier electrostatic discharge clamp for a high voltage laterally diffused MOS transistor

Method and circuit for reducing degradation in a regulated circuit

Silicon germanium CMOS channel

Methods for forming super-steep diffusion region profiles in MOS devices and resulting semiconductor topographies