Nirasaki
Japan
11
2021-12-02
The entities that hold a legal rights for patent applications filed by inventor Fujihara Jun:
Jun Fujihara from Nirasaki, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
Inspection apparatus and inspection method
#2 | 2021-10-28Testing system
#3 | 2021-03-04Prober and probe card cleaning method
#4 | 2021-02-18Prober and probe card precooling method
#5 | 2020-12-31Prober and method of preheating probe card
#6 | 2020-07-16Chuck top, inspection apparatus, and chuck top recovery method
#7 | 2020-03-26Inspection apparatus and inspection method
#8 | 2020-03-26Inspection apparatus and inspection method for inspecting electrical characteristic of electronic device
#9 | 2020-01-16Intermediate connection member and inspection apparatus
#10 | 2019-09-05Substrate inspection method and substrate inspection device
#11 | 2019-08-29Inspection system
6020597 ⎘