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Inventor profile of:

Dieter WINKLER

City:

Munchen

Country:

Germany

Published Applications:

22

Last publication date:

2025-04-17

Top Assignees for applications by Dieter WINKLER

The entities that hold a legal rights for patent applications filed by inventor WINKLER Dieter:

ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH 16 Heimstetten, Germany
Applied Materials, Inc. 4 Santa Clara, CA United States
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH 1 Hemstetten, Germany

Recent patent applications by WINKLER Dieter

Dieter WINKLER from Munchen, DE has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-04-17

US20250125118A1

DETECTOR DEVICE, ELECTRON BEAM APPARATUS, AND METHOD FOR INSPECTING AND/OR IMAGING A SAMPLE

#2 | 2022-10-20

US20220336186A1

Charged particle beam apparatus, multi-beamlet assembly, and method of inspecting a specimen

#3 | 2022-09-01

US20220277921A1

Method of influencing a charged particle beam, multipole device, and charged particle beam apparatus

#4 | 2021-11-25

US20210366686A1

Charged particle beam device and method for inspecting and/or imaging a sample

#5 | 2021-11-25

US20210366683A1

Charged particle beam device and method for inspecting and/or imaging a sample

#6 | 2021-08-05

US20210241990A1

Method of operating a charged particle gun, charged particle gun, and charged particle beam device

#7 | 2020-09-24

US20200303156A1

BEAM SPLITTER FOR A CHARGED PARTICLE DEVICE

#8 | 2020-08-13

US20200258714A1

Device and method for operating a charged particle device with multiple beamlets

#9 | 2020-06-25

US20200203116A1

Charged particle beam device, interchangeable multi-aperture arrangement for a charged particle beam device, and method for operating a charged particle beam device

#10 | 2020-01-23

US20200027687A1

Charged particle beam device, multi-beam blanker for a charged particle beam device, and method for operating a charged particle beam device

#11 | 2019-11-19

US16037815

Charged particle beam device, multi-beam blanker for a charged particle beam device, and method for operating a charged particle beam device

#12 | 2019-01-17

US20190019649A1

Charged particle beam device, charged particle beam influencing device, and method of operating a charged particle beam device

#13 | 2017-05-25

US20170148609A1

Electrostatic multipole device, electrostatic multipole arrangement, and method of manufacturing an electrostatic multipole device

#14 | 2017-04-11

US14947609

Electrostatic multipole device, electrostatic multipole arrangement, charged particle beam device, and method of manufacturing an electrostatic multipole device

#15 | 2017-03-16

US20170076910A1

System for imaging a secondary charged particle beam with adaptive secondary charged particle optics

#16 | 2017-01-05

US20170003235A1

System and method for imaging a secondary charged particle beam with adaptive secondary charged particle optics

#17 | 2013-01-31

US20130026385A1

Shielding member having a charge control electrode, and a charged particle beam apparatus

#18 | 2007-06-28

US20070145269A1

Electron anti-fogging baffle used as a detector

#19 | 2007-04-05

US20070075262A1

Electrostatic deflection system with low aberrations and vertical beam incidence

#20 | 2007-04-05

US20070075256A1

Electrostatic deflection system with impedance matching for high positioning accuracy

#21 | 2006-07-11

US10823968

Charged particle beam microscope with minicolumn

#22 | 2005-09-13

US10258869

Multi beam charged particle device

InventorID:

60819 ⎘