Tokyo
Japan
9
2021-01-14
The entities that hold a legal rights for patent applications filed by inventor Hayashi Takehide:
Takehide Hayashi from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:
Adjustment method and electron beam device
#2 | 2020-12-31Method for evaluating secondary optical system of electron beam inspection device
#3 | 2016-11-03Inspection apparatus
#4 | 2016-10-20Inspection device
#5 | 2015-10-08Inspection apparatus
#6 | 2014-04-03Electro-optical inspection apparatus and method with dust or particle collection function
#7 | 2014-01-16INSPECTION DEVICE
#8 | 2012-09-20Inspection device
#9 | 2012-03-29Electro-optical inspection apparatus and method with dust or particle collection function
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