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Inventor profile of:

Takehide Hayashi

City:

Tokyo

Country:

Japan

Published Applications:

9

Last publication date:

2021-01-14

Top Assignees for applications by Takehide Hayashi

The entities that hold a legal rights for patent applications filed by inventor Hayashi Takehide:

  • Ebara Corporation 9 Tokyo, Japan

Recent patent applications by Hayashi Takehide

Takehide Hayashi from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2021-01-14
US20210012997A1
Electricity

Adjustment method and electron beam device

#2 | 2020-12-31
US20200411279A1
Electricity

Method for evaluating secondary optical system of electron beam inspection device

#3 | 2016-11-03
US20160322192A1
Electricity

Inspection apparatus

#4 | 2016-10-20
US20160307726A1
Electricity

Inspection device

#5 | 2015-10-08
US20150287570A1
Electricity

Inspection apparatus

#6 | 2014-04-03
US20140091215A1
Electricity

Electro-optical inspection apparatus and method with dust or particle collection function

#7 | 2014-01-16
US20140014848A1
Physics

INSPECTION DEVICE

#8 | 2012-09-20
US20120235036A1
Physics

Inspection device

#9 | 2012-03-29
US20120074316A1
Electricity

Electro-optical inspection apparatus and method with dust or particle collection function

InventorID:

610799 ⎘

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