Santa Clara, California
United States
15
2024-12-05
The entities that hold a legal rights for patent applications filed by inventor Koonmen James Patrick:
James Patrick Koonmen from Santa Clara, US has applied for patents for these inventions. The list has both pending applications and granted patents:
COMPUTATIONAL WAFER INSPECTION
#2 | 2021-11-18Computational wafer inspection
#3 | 2020-07-09Computational wafer inspection
#4 | 2020-06-18MODEL-BASED SCANNER TUNING SYSTEMS AND METHODS
#5 | 2018-12-20Computational wafer inspection
#6 | 2017-02-16Computational wafer inspection
#7 | 2015-12-10Computational wafer inspection
#8 | 2015-02-12Model-based scanner tuning systems and methods
#9 | 2015-01-22Computational process control
#10 | 2014-11-27Model-based process simulation systems and methods
#11 | 2014-02-13Model-based scanner tuning systems and methods
#12 | 2012-11-29Computational process control
#13 | 2010-06-10Scanner model representation with transmission cross coefficients
#14 | 2010-01-14Model-based scanner tuning systems and methods
#15 | 2009-12-03Model-based process simulation systems and methods
652671 ⎘