Shin Inoue

City:

Koshi

Country:

Japan

Published Applications:

Last publication date:

2021-06-03

Top Assignees for applications by Shin Inoue

The entities that hold a legal rights for patent applications filed by inventor Inoue Shin:

Shin Inoue from Koshi, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Substrate defect inspection method, storage medium, and substrate defect inspection apparatus

InventorID:

6563398 ⎘