Santa Clara, California
United States
8
2019-03-07
The entities that hold a legal rights for patent applications filed by inventor Mahadevan Mohan:
Mohan Mahadevan from Santa Clara, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Unified neural network for defect detection and classification
#2 | 2018-11-29Semiconductor inspection and metrology systems for distributing job among the CPUs or GPUs based on logical image processing boundaries
#3 | 2018-01-04Apparatus and methods for combined brightfield, darkfield, and photothermal inspection
#4 | 2016-12-22Automated image-based process monitoring and control
#5 | 2015-12-24In-line wafer edge inspection, wafer pre-alignment, and wafer cleaning
#6 | 2015-08-27Automated inline inspection and metrology using shadow-gram images
#7 | 2015-08-13Apparatus and methods for combined brightfield, darkfield, and photothermal inspection
#8 | 2014-02-20Automated inspection scenario generation
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