Patrick Tae

City:

San Jose, California

Country:

United States

Published Applications:

Last publication date:

2024-06-20

Top Assignees for applications by Patrick Tae

The entities that hold a legal rights for patent applications filed by inventor Tae Patrick:

Patrick Tae from San Jose, US has applied for patents for these inventions. The list has both pending applications and granted patents:

EXTREME ULTRAVIOLET SOURCE TEMPERATURE MONITORING USING CONFOCAL SENSOR

Confocal Chromatic Metrology for EUV Source Condition Monitoring

InventorID:

6600471 ⎘