JONGCHEON SUN

City:

SUWON-SI

Country:

South Korea

Published Applications:

Last publication date:

2026-04-16

Top Assignees for applications by JONGCHEON SUN

The entities that hold a legal rights for patent applications filed by inventor SUN JONGCHEON:

JONGCHEON SUN from SUWON-SI, KR has applied for patents for these inventions. The list has both pending applications and granted patents:

SEMICONDUCTOR DEVICE IMAGING METHOD

SYSTEM, DEVICE AND METHOD OF CONTROLLING EMISSION CURRENT OF ELECTRON MICROSCOPE

PATTERN INSPECTION SYSTEM AND METHOD OF PATTERN INSPECTION USING THE SAME

SEMICONDUCTOR DEVICE INSPECTION METHOD

WAFER INSPECTION METHOD

SCANNING ELECTRON MICROSCOPE DEVICE

METHOD OF GENERATING DEFECT CLASSIFICATION MODEL

SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD

InventorID:

6673107 ⎘