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Inventor profile of:

Minoru Harada

City:

Tokyo

Country:

Japan

Published Applications:

Last publication date:

2025-04-17

Top Assignees for applications by Minoru Harada

The entities that hold a legal rights for patent applications filed by inventor Harada Minoru:

HITACHI HIGH-TECHNOLOGIES CORPORATION 11 Tokyo, Japan
HITACHI HIGH-TECH CORPORATION 11 Tokyo, Japan
Hitachi High-Technologies Corporation 2 Minato-ku, TOKYO, Japan
Ebara Corporation 1 Tokyo, Japan
OLYMPUS TERUMO BIOMATERIALS CORP. 1 Tokyo, Japan
Hitachi Hich-Technologies Corporation 1 Tokyo, Japan

Recent patent applications by Harada Minoru

Minoru Harada from Tokyo, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-04-17

US20250124566A1

Physics

Defect Inspection System and Defect Inspection Method

#2 | 2023-02-16

US20230052350A1

Physics

Defect inspecting system and defect inspecting method

#3 | 2023-01-05

US20230005123A1

Physics

SAMPLE OBSERVATION SYSTEM AND IMAGE PROCESSING METHOD

#4 | 2022-12-22

US20220405905A1

Physics

Sample observation device and method

#5 | 2021-06-17

US20210177473A1

Human necessities

Bone plate and bone plate kit

#6 | 2020-12-31

US20200411345A1

Electricity

Wafer observation apparatus and wafer observation method

#7 | 2020-10-22

US20200335300A1

Electricity

Defect observation device

#8 | 2020-04-23

US20200126201A1

Physics

Sample observation device and sample observation method

#9 | 2020-03-12

US20200083017A1

Electricity

Defect observation system and defect observation method for semiconductor wafer

#10 | 2020-01-30

US20200034957A1

Physics

Defect observation device and defect observation method

#11 | 2019-08-29

US20190266713A1

Physics

Wafer observation device

#12 | 2019-07-18

US20190217438A1

Performing operations; transporting

Substrate processing apparatus and control method

#13 | 2019-05-09

US20190139210A1

Physics

Defect classification apparatus and defect classification method

#14 | 2018-08-23

US20180240225A1

Physics

Sample observation device and sample observation method

#15 | 2018-06-21

US20180174000A1

Physics

DEFECT IMAGE CLASSIFICATION DEVICE AND DEFECT IMAGE CLASSIFICATION METHOD

#16 | 2018-01-25

US20180025482A1

Physics

Method for measuring overlay and measuring apparatus, scanning electron microscope, and GUI

#17 | 2018-01-18

US20180019097A1

Electricity

Sample observation method and sample observation device

#18 | 2017-10-05

US20170282132A1

Performing operations; transporting

GAS-DISSOLVED WATER PRODUCTION DEVICE AND PRODUCTION METHOD

#19 | 2016-01-21

US20160019682A1

Physics

Defect inspection method and defect inspection device

#20 | 2015-11-19

US20150332445A1

Physics

Defect observation method and defect observation device

#21 | 2015-10-22

US20150302568A1

Physics

Defect observation method and defect observation device

#22 | 2014-12-25

US20140375793A1

Physics

Method for measuring overlay and measuring apparatus, scanning electron microscope, and GUI

#23 | 2014-11-06

US20140331173A1

Physics

Defect classification apparatus and defect classification method

#24 | 2014-08-07

US20140219546A1

Physics

Method and apparatus for reviewing defect

#25 | 2014-06-19

US20140169657A1

Physics

Defect inspection method and defect inspection device

#26 | 2014-03-13

US20140072204A1

Physics

Defect classification method, and defect classification system

#27 | 2010-12-30

US20100333009A1

Physics

OPERATION SUPPORT APPARATUS, OPERATION SUPPORT METHOD AND COMPUTER PROGRAM

InventorID:

685095 ⎘