Eindhoven
Netherlands
29
2024-02-08
The entities that hold a legal rights for patent applications filed by inventor Ten Berge Peter:
Peter Ten Berge from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:
METHOD FOR CONTROLLING A MANUFACTURING PROCESS AND ASSOCIATED APPARATUSES
#2 | 2023-06-08METHOD FOR OPTIMIZING A SAMPLING SCHEME AND ASSOCIATED APPARATUSES
#3 | 2023-04-06Method for controlling a manufacturing process and associated apparatuses
#4 | 2022-01-27METHOD AND APPARATUS FOR INSPECTION AND METROLOGY
#5 | 2021-10-21Method to predict yield of a device manufacturing process
#6 | 2021-07-15Methods and apparatus for measuring a property of a substrate
#7 | 2020-10-08Methods and apparatus for measuring a property of a substrate
#8 | 2020-04-23Method and system for increasing accuracy of pattern positioning
#9 | 2020-04-02Method to predict yield of a device manufacturing process
#10 | 2019-10-03Methods and apparatus for measuring a property of a substrate
#11 | 2019-08-22Method for determining an optimized set of measurement locations for measurement of a parameter of a lithographic process, metrology system and computer program products for implementing such methods
#12 | 2019-07-11METHOD AND APPARATUS TO MONITOR A PROCESS APPARATUS
#13 | 2018-11-08Method and apparatus to correct for patterning process error
#14 | 2018-11-01Method and apparatus to reduce effects of nonlinear behavior
#15 | 2018-10-25Method and apparatus to correct for patterning process error
#16 | 2018-10-18METHOD AND APPARATUS TO CORRECT FOR PATTERNING PROCESS ERROR
#17 | 2018-09-06Method and apparatus to correct for patterning process error
#18 | 2018-03-08Method and apparatus for inspection and metrology
#19 | 2017-06-08Methods and apparatus for measuring a property of a substrate
#20 | 2014-12-04Methods and apparatus for measuring a property of a substrate
#21 | 2014-03-27Inspection method and apparatus and lithographic processing cell
#22 | 2010-03-11LITHOGRAPHIC APPARATUS AND ALIGNMENT METHOD
#23 | 2008-05-22Lithographic apparatus and method
#24 | 2008-04-10Lithographic apparatus and device manufacturing method
#25 | 2007-11-22Imprint lithographic apparatus, device manufacturing method and device manufactured thereby
#26 | 2007-01-25Pre-aligning a substrate in a lithographic apparatus, device manufacturing method, and device manufactured by the manufacturing method
#27 | 2006-12-21Pre-aligning a substrate in a lithographic apparatus, device manufacturing method, and device manufactured by the manufacturing method
#28 | 2006-08-03Method and system for 3D alignment in wafer scale integration
#29 | 2005-06-02Substrate, method of preparing a substrate, method of measurement, lithographic apparatus, device manufacturing method and device manufactured thereby, and machine-readable storage medium
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