Austin, Texas
United States
17
2026-06-04
The entities that hold a legal rights for patent applications filed by inventor Abel Kate:
Kate Abel from Austin, US has applied for patents for these inventions. The list has both pending applications and granted patents:
APPARATUSES AND METHODS FOR ETCHING PROCESS
#2 | 2026-05-14METHODS FOR PROTECTING A SURFACE PRIOR TO ETCHING TO OPTIMIZE ETCH PERFORMANCE
#3 | 2026-05-14METHODS FOR OXIDIZING A SUBSTRATE SURFACE USING GAS PHASE OXIDIZING RADICALS
#4 | 2026-04-16METHODS FOR CONDITIONING A SURFACE PRIOR TO ETCHING TO OPTIMIZE ETCH PERFORMANCE
#5 | 2026-04-02METHODS FOR WET ATOMIC LAYER ETCHING OF TITANIUM NITRIDE USING HALOGENATION
#6 | 2026-02-12METHOD TO SELECTIVELY ETCH SILICON NITRIDE TO SILICON OXIDE USING SURFACE ALKYLATION
#7 | 2026-01-22OVERLAYER FILMS AND METHODS FOR ETCHING SILICON-CONTAINING MATERIALS USING A LOW TEMPERATURE DRY CHEMICAL ETCH PROCESS
#8 | 2025-12-04METHODS FOR CONTROLLING THE PHASE OF SELF-ASSEMBLED IONIC LIQUID CRYSTAL (ILC) STRUCTURES
#9 | 2025-10-02METHODS FOR WET ATOMIC LAYER ETCHING OF TUNGSTEN USING HALOGENATION
#10 | 2025-10-02METHODS FOR WET ATOMIC LAYER ETCHING OF TUNGSTEN
#11 | 2025-09-18METHODS FOR WET ATOMIC LAYER ETCHING OF SILICON DIOXIDE
#12 | 2025-08-28Methods To Improve Etch Uniformity Across A Semiconductor Substrate When Etching With A Hydrofluoric Acid (HF) And Nitric Acid (HNO3) Solution
#13 | 2025-08-26Methods for controlling the pitch of self-assembled ionic liquid crystal (ILC) structures
#14 | 2025-07-10INTEGRATED OPTICAL NANOTHERMOMETRY FOR REAL-TIME WAFER TEMPERATURE MONITORING DURING PROCESSING
#15 | 2025-06-19METHODS FOR WET ATOMIC LAYER ETCHING OF TRANSITION METAL OXIDE DIELECTRIC MATERIALS
#16 | 2025-05-15METHODS FOR PATTERNING A SEMICONDUCTOR SUBSTRATE USING METALATE SALT IONIC LIQUID CRYSTALS
#17 | 2023-04-20Methods For Non-Isothermal Wet Atomic Layer Etching
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