Ryuji Ohno

City:

Saitama

Country:

Japan

Published Applications:

Last publication date:

2014-04-10

Top Assignees for applications by Ryuji Ohno

The entities that hold a legal rights for patent applications filed by inventor Ohno Ryuji:

Ryuji Ohno from Saitama, JP has applied for patents for these inventions. The list has both pending applications and granted patents:

Method of evaluating metal contamination in semiconductor sample and method of manufacturing semiconductor substrate

InventorID:

717433 ⎘