San Jose, California
United States
8
2011-08-16
The entities that hold a legal rights for patent applications filed by inventor Mark David:
David Mark from San Jose, US has applied for patents for these inventions. The list has both pending applications and granted patents:
Method of metal pattern inspection verification
#2 | 2008-11-18Method of and system for monitoring the functionality of a wafer probe site
#3 | 2008-04-22Circuit for and method of determining the location of a defect in an integrated circuit
#4 | 2007-08-28Method for gross I/O functional test at wafer sort
#5 | 2007-06-05Test circuit for and method of identifying a defect in an integrated circuit
#6 | 2006-12-05Method and circuits for localizing defective interconnect resources in programmable logic devices
#7 | 2006-10-17Methods of testing interconnect lines in programmable logic devices using partial reconfiguration
#8 | 2005-05-03Method and apparatus for localizing faults within a programmable logic device
7252277 ⎘