Suwon
South Korea
5
2007-10-09
The entities that hold a legal rights for patent applications filed by inventor Jun Chung-Sam:
Chung-Sam Jun from Suwon, KR has applied for patents for these inventions. The list has both pending applications and granted patents:
Method and apparatus for inspecting an edge exposure area of a wafer
#2 | 2006-07-25Method and apparatus for obtaining an image using a selective combination of wavelengths of light
#3 | 2006-05-16Method of measuring and controlling concentration of dopants of a thin film
#4 | 2006-04-11Wafer color variation correcting method, selective wafer defect detecting method, and computer readable recording media for the same
#5 | 2005-08-09Method and apparatus for measuring contamination of a semiconductor substrate
7293228 ⎘