Guy Ben Dov

City:

Haifa

Country:

Israel

Published Applications:

Last publication date:

2021-07-01

Top Assignees for applications by Guy Ben Dov

The entities that hold a legal rights for patent applications filed by inventor Dov Guy Ben:

Guy Ben Dov from Haifa, IL has applied for patents for these inventions. The list has both pending applications and granted patents:

Field-to-field corrections using overlay targets

Field-to-field corrections using overlay targets

Symmetric target design in scatterometry overlay metrology

Symmetric target design in scatterometry overlay metrology

Pupil plane calibration for scatterometry overlay measurement

Phase characterization of targets

InventorID:

734746 ⎘