Berkeley, California
United States
14
2026-02-19
The entities that hold a legal rights for patent applications filed by inventor Mueller Ulrich:
Ulrich Mueller from Berkeley, US has applied for patents for these inventions. The list has both pending applications and granted patents:
ON TOOL METROLOGY SCHEME FOR ADVANCED PACKAGING
#2 | 2026-01-22DIGITAL LITHOGRAPHY APPARATUS WITH IMAGING DEVICE POSITIONED TO MITIGATE MOIRE EFFECT
#3 | 2025-11-13PACKAGE IMAGING FOR DIE LOCATION CORRECTION IN DIGITAL LITHOGRAPHY
#4 | 2025-09-11INSPECTION OF LITHOGRAPHIC LAYERS AND DYNAMIC DATA VIA INLINE METROLOGY
#5 | 2025-09-04SHORTWAVE INFRARED INSPECTION OF PATTERNED SUBSTRATES USING FOCUS AVERAGING
#6 | 2025-08-28COMBINATION OF INLINE METROLOGY AND ON TOOL METROLOGY FOR ADVANCED PACKAGING
#7 | 2025-03-06ADVANCED-PACKAGING HIGH-VOLUME-MODE DIGITAL-LITHOGRAPHY-TOOL
#8 | 2024-06-20COMBINATION OF INLINE METROLOGY AND ON TOOL METROLOGY FOR ADVANCED PACKAGING
#9 | 2024-02-08ACTIVE LINEAR MOTOR PARASITIC FORCE COMPENSATION
#10 | 2024-01-25Advanced-packaging high-volume-mode digital-lithography-tool
#11 | 2023-09-21MULTIPLEXED HOLOGRAM INTERFERENCE EXPOSURE SYSTEM
#12 | 2023-09-14PACKAGE IMAGING FOR DIE LOCATION CORRECTION IN DIGITAL LITHOGRAPHY
#13 | 2023-07-13MACHINE MEASUREMENT METROLOGY FRAME FOR A LITHOGRAPHY SYSTEM
#14 | 2014-05-01OPTICAL GRATING INCLUDING A SMOOTHING LAYER
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