Carmiel
Israel
5
2016-10-27
The entities that hold a legal rights for patent applications filed by inventor Efraty Boris:
Boris Efraty from Carmiel, IL has applied for patents for these inventions. The list has both pending applications and granted patents:
Method of analyzing and utilizing landscapes to reduce or eliminate inaccuracy in overlay optical metrology
#2 | 2016-08-11Quality estimation and improvement of imaging metrology targets
#3 | 2016-03-24Wafer notch detection
#4 | 2015-11-05Removing process-variation-related inaccuracies from scatterometry measurements
#5 | 2014-05-15Method, system, and user interface for metrology target characterization
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