Yuwei JIN

City:

Eindhoven

Country:

Netherlands

Published Applications:

Last publication date:

2026-03-12

Top Assignees for applications by Yuwei JIN

The entities that hold a legal rights for patent applications filed by inventor JIN Yuwei:

Yuwei JIN from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

LITHOGRAPHIC APPARATUS, METROLOGY SYSTEMS FOR CONTROLLING OPTICAL ABERRATIONS, AND METHOD THEREOF

InventorID:

7729433 ⎘