Inventor profile of:

Emil Peter SCHMITT-WEAVER

City:

Eindhoven

Country:

Netherlands

Published Applications:

16

Last publication date:

2022-08-18

Top Assignees for applications by Emil Peter SCHMITT-WEAVER

The entities that hold a legal rights for patent applications filed by inventor SCHMITT-WEAVER Emil Peter:

Recent patent applications by SCHMITT-WEAVER Emil Peter

Emil Peter SCHMITT-WEAVER from Eindhoven, NL has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2022-08-18
US20220260925A1
Physics

Computational metrology

#2 | 2022-02-03
US20220035259A1
Physics

Method of obtaining measurements, apparatus for performing a process step, and metrology apparatus

#3 | 2022-01-27
US20220026809A1
Physics

Method for monitoring lithographic apparatus

#4 | 2021-06-24
US20210191278A1
Physics

Computational metrology

#5 | 2021-01-21
US20210018847A1
Physics

Methods and apparatus for monitoring a lithographic manufacturing process

#6 | 2020-07-09
US20200218170A1
Physics

Calibration method for a lithographic apparatus

#7 | 2020-04-30
US20200133144A1
Physics

System and method for measurement of alignment

#8 | 2020-01-02
US20200004164A1
Physics

Methods and apparatus for monitoring a lithographic manufacturing process

#9 | 2019-11-28
US20190361358A1
Physics

Computational metrology

#10 | 2019-05-09
US20190137892A1
Physics

Method of obtaining measurements, apparatus for performing a process step, and metrology apparatus

#11 | 2019-03-28
US20190094713A1
Physics

Method for adjusting actuation of a lithographic apparatus

#12 | 2019-02-28
US20190064680A1
Physics

Mark position determination method

#13 | 2018-06-21
US20180173118A1
Physics

Calibration method for a lithographic apparatus

#14 | 2016-12-22
US20160370711A1
Physics

Lithographic apparatus with data processing apparatus

#15 | 2014-06-19
US20140168627A1
Physics

Method of operating a lithographic apparatus, device manufacturing method and associated data processing apparatus and computer program product

#16 | 2014-06-19
US20140168620A1
Physics

Method of calibrating a lithographic apparatus, device manufacturing method and associated data processing apparatus and computer program product

InventorID:

803712 ⎘