Inventor profile of:

Nicolas POSSEME

City:

Grenoble

Country:

France

Published Applications:

47

Last publication date:

2025-01-30

Recent patent applications by POSSEME Nicolas

Nicolas POSSEME from Grenoble, FR has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2025-01-30
US20250040455A1
Electricity

METHOD OF MANUFACTURING AN ELECTRONIC COMPONENT

#2 | 2024-10-10
US20240341201A1
Electricity

METHOD FOR MAKING AN ELECTRONIC DEVICE WITH SUPERCONDUCTOR QUBIT(S) INCLUDING AT LEAST ONE JOFET

#3 | 2024-10-03
US20240326297A1
Performing operations; transporting

Method for manufacturing a mould for nanoprinting and associated mould

#4 | 2023-10-12
US20230326745A1
Electricity

METHOD FOR PRODUCING A LAYER ON ONLY CERTAIN SURFACES OF A STRUCTURE

#5 | 2023-06-29
US20230207311A1
Electricity

METHOD FOR ACTIVATING AN EXPOSED LAYER

#6 | 2023-06-15
US20230186136A1
Physics

METHOD FOR MAKING A QUANTUM DEVICE

#7 | 2023-04-20
US20230120901A1
Electricity

DEVICE COMPRISING SPACERS INCLUDING A LOCALISED AIRGAP AND ASSOCIATED MANUFACTURING METHODS

#8 | 2022-11-03
US20220352344A1
Electricity

Method of forming the spacers of a transistor gate

#9 | 2022-11-03
US20220350252A1
Physics

PROCESS FOR HYBRID SURFACE STRUCTURING BY PLASMA ETCHING

#10 | 2022-08-25
US20220271149A1
Electricity

METHOD OF ENGRAVING A THREE-DIMENSIONAL DIELECTRIC LAYER

#11 | 2022-08-25
US20220270888A1
Electricity

METHOD FOR ETCHING A THREE-DIMENSIONAL DIELECTRIC LAYER

#12 | 2022-08-25
US20220270880A1
Electricity

Method of forming the spacers on lateral flanks of a transistor gate using successive implantation phases

#13 | 2022-07-21
US20220231147A1
Electricity

SEMICONDUCTOR DEVICE AND ASSOCIATED MANUFACTURING METHOD

#14 | 2022-06-02
US20220173229A1
Electricity

QUANTUM DEVICE AND METHOD FOR PRODUCING THE SAME

#15 | 2022-06-02
US20220173163A1
Electricity

Method for increasing the surface roughness of a metal layer

#16 | 2022-06-02
US20220172959A1
Electricity

Method for increasing the surface roughness of a metal layer

#17 | 2022-06-02
US20220172093A1
Physics

Method of making a quantum device

#18 | 2022-03-03
US20220068724A1
Electricity

Method of manufacturing microelectronic components

#19 | 2022-01-27
US20220028803A1
Electricity

Method of making an individualization zone of an integrated circuit

#20 | 2021-03-25
US20210090880A1
Electricity

Method of etching a layer based on a III-V material

#21 | 2021-03-04
US20210066133A1
Electricity

Method for producing a component by filling a cavity within an electrical isolation area with carbon-based material

#22 | 2021-02-25
US20210057283A1
Electricity

Method for manufacturing microelectronic components

#23 | 2021-01-14
US20210013089A1
Electricity

Method for forming trenches

#24 | 2021-01-14
US20210013040A1
Electricity

Method for forming spacers of a transistor

#25 | 2021-01-07
US20210005443A1
Electricity

Method for producing at least one device in compressive strained semiconductor

#26 | 2020-08-06
US20200251570A1
Electricity

Method for etching a three-dimensional dielectric layer

#27 | 2020-08-06
US20200251569A1
Electricity

Method of manufacturing a transistor with a raised source and drain

#28 | 2020-07-16
US20200227271A1
Electricity

Method of etching a dielectric layer

#29 | 2020-07-02
US20200211906A1
Electricity

Method of producing microelectronic components

#30 | 2020-06-25
US20200203161A1
Electricity

Method for fabricating an integrated circuit including a NMOS transistor and a PMOS transistor

#31 | 2020-06-11
US20200185497A1
Electricity

Method for manufacturing an electronic component having multiple quantum dots

#32 | 2016-10-13
US20160300709A1
Electricity

Method for forming spacers for a transistor gate

#33 | 2016-09-01
US20160254165A1
Electricity

Selective etching process of a mask disposed on a silicon substrate

#34 | 2016-08-18
US20160240371A1
Electricity

Protection method for protecting a silicide layer

#35 | 2016-06-23
US20160181155A1
Electricity

METHOD FOR MAKING AN INTEGRATED CIRCUIT IN THREE DIMENSIONS

#36 | 2016-03-17
US20160079396A1
Electricity

Method for the surface etching of a three-dimensional structure

#37 | 2016-03-17
US20160079388A1
Electricity

Production of spacers at flanks of a transistor gate

#38 | 2016-02-04
US20160035581A1
Electricity

Microelectronic method for etching a layer

#39 | 2016-01-21
US20160020152A1
Electricity

METHOD OF FORMING SPACERS FOR A GATE OF A TRANSISTOR

#40 | 2016-01-21
US20160020141A1
Electricity

Method of forming contact openings for a transistor

#41 | 2015-09-24
US20150270163A1
Electricity

Method of etching a porous dielectric material

#42 | 2015-08-13
US20150228495A1
Electricity

Plasma etching process

#43 | 2015-06-11
US20150162190A1
Electricity

Method for forming spacers for a transistor gate

#44 | 2014-07-03
US20140187050A1
Electricity

Method for isotropic etching

#45 | 2014-07-03
US20140187046A1
Electricity

METHOD FOR FORMING SPACERS FOR A TRANSITOR GATE

#46 | 2014-07-03
US20140187035A1
Electricity

Method of etching a porous dielectric material

#47 | 2014-07-03
US20140183159A1
Electricity

Method of obtaining patters in an antireflective layer

InventorID:

820155