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Inventor profile of:

Phillip Walsh

City:

Austin, Texas

Country:

United States

Published Applications:

22

Last publication date:

2017-02-02

Top Assignees for applications by Phillip Walsh

The entities that hold a legal rights for patent applications filed by inventor Walsh Phillip:

VUV Analytics, Inc. 8 Austin, TX United States
JORDAN VALLEY SEMICONDUCTORS LTD. 5 Migdal HaEmek, Israel
MetroSol, Inc. 3 Austin, TX United States
Jordan Valley Semiconductor Ltd 1 Nigdal Haemek, Israel
Jordan Valley Semiconductors Ltd. 1 Migdal Haemer, Israel
VUV ANALYTICS, INC. 1 Lakeway, TX United States
VUV Analytics, Inc. 1 Cedar Park, TX United States

Recent patent applications by Walsh Phillip

Phillip Walsh from Austin, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2017-02-02

US20170030874A1

Vacuum ultraviolet absorption spectroscopy system and method

#2 | 2017-02-02

US20170030828A1

Vacuum ultraviolet absorption spectroscopy system and method

#3 | 2016-12-29

US20160377581A1

Vacuum ultraviolet absorption spectroscopy system and method

#4 | 2016-12-29

US20160377531A1

Vacuum ultraviolet absorption spectroscopy system and method

#5 | 2016-12-15

US20160363569A1

Method for detailed and bulk classification analysis of complex samples using vacuum ultra-violet spectroscopy and gas chromatography

#6 | 2015-03-05

US20150059440A1

Vacuum ultraviolet absorption spectroscopy system and method

#7 | 2014-09-18

US20140264053A1

Methods and apparatus for vacuum ultraviolet (VUV) or shorter wavelength circular dichroism spectroscopy

#8 | 2014-07-10

US20140192343A1

Vacuum ultraviolet absorption spectroscopy system and method

#9 | 2012-10-25

US20120268740A1

Methods and apparatus for vacuum ultraviolet (VUV) or shorter wavelength circular dichroism spectroscopy

#10 | 2012-07-19

US20120182542A1

Optical vacuum ultra-violet wavelength nanoimprint metrology

#11 | 2012-07-05

US20120170021A1

Method and apparatus for providing multiple wavelength reflectance magnitude and phase for a sample

#12 | 2010-11-25

US20100294922A1

Automated calibration methodology for VUV metrology system

#13 | 2010-11-18

US20100290033A1

Method and system for using reflectometry below deep ultra-violet (DUV) wavelengths for measuring properties of diffracting or scattering structures on substrate work pieces

#14 | 2010-11-04

US20100277741A1

COMBINED OPTICAL METROLOGY TECHNIQUES

#15 | 2010-07-15

US20100177324A1

Method and apparatus for optically measuring periodic structures using orthogonal azimuthal sample orientation

#16 | 2010-07-08

US20100171959A1

Method and apparatus for using multiple relative reflectance measurements to determine properties of a sample using vacuum ultra violet wavelengths

#17 | 2009-09-03

US20090219537A1

Method and apparatus for using multiple relative reflectance measurements to determine properties of a sample using vacuum ultra violet wavelengths

#18 | 2008-10-09

US20080246951A1

Method and system for using reflectometry below deep ultra-violet (DUV) wavelengths for measuring properties of diffracting or scattering structures on substrate work-pieces

#19 | 2008-06-05

US20080129986A1

Method and apparatus for optically measuring periodic structures using orthogonal azimuthal sample orientations

#20 | 2007-09-20

US20070215801A1

Method and apparatus for accurate calibration of a reflectometer by using a relative reflectance measurement

#21 | 2007-08-09

US20070181795A1

Method and apparatus for accurate calibration of a reflectometer by using a relative reflectance measurement

#22 | 2007-08-09

US20070181794A1

Method and apparatus for accurate calibration of a reflectometer by using a relative reflectance measurement

InventorID:

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