Inventor profile of:

Mark Hoinkis

City:

Fishkill, New York

Country:

United States

Published Applications:

19

Last publication date:

2015-10-08

Top Assignees for applications by Mark Hoinkis

The entities that hold a legal rights for patent applications filed by inventor Hoinkis Mark:

Recent patent applications by Hoinkis Mark

Mark Hoinkis from Fishkill, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2015-10-08
US20150287634A1
Electricity

Methods for etching a metal layer to form an interconnection structure for semiconductor applications

#2 | 2015-01-15
US20150014152A1
Chemistry; metallurgy

Selective sputtering for pattern transfer

#3 | 2014-11-27
US20140345645A1
Electricity

Copper residue chamber clean

#4 | 2014-09-18
US20140273437A1
Electricity

Subtractive plasma etching of a blanket layer of metal or metal alloy

#5 | 2008-09-04
US20080213993A1
Electricity

Method and apparatus of stress relief in semiconductor structures

#6 | 2008-05-06
US10439874
-

Method and apparatus of stress relief in semiconductor structures

#7 | 2007-07-10
US10318606
-

Method for depositing a metal layer on a semiconductor interconnect structure having a capping layer

#8 | 2007-03-15
US20070059922A1
Electricity

Post-etch removal of fluorocarbon-based residues from a hybrid dielectric structure

#9 | 2006-12-28
US20060292852A1
Electricity

Back end interconnect with a shaped interface

#10 | 2006-06-13
US10379346
-

Reduction of the shear stress in copper via's in organic interlayer dielectric material

#11 | 2006-06-01
US20060113278A1
Electricity

Bilayered metal hardmasks for use in dual damascene etch schemes

#12 | 2006-05-30
US10461090
-

Bilayered metal hardmasks for use in Dual Damascene etch schemes

#13 | 2005-10-06
US20050221610A1
Electricity

Method and apparatus of stress relief in semiconductor structures

#14 | 2005-09-22
US20050208742A1
Electricity

OXIDIZED TANTALUM NITRIDE AS AN IMPROVED HARDMASK IN DUAL-DAMASCENE PROCESSING

#15 | 2005-06-02
US20050116342A1
Electricity

Device interconnection

#16 | 2005-05-26
US20050112864A1
Electricity

Back end interconnect with a shaped interface

#17 | 2005-05-26
US20050112862A1
Electricity

Crystallographic modification of hard mask properties

#18 | 2005-04-14
US20050077628A1
Electricity

Dual damascene structure and method

#19 | 2005-03-22
US9052688
-

Device interconnection

InventorID:

979227 ⎘