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Inventor profile of:

Steven Kasapi

City:

San Francisco, California

Country:

United States

Published Applications:

Last publication date:

2016-05-12

Top Assignees for applications by Steven Kasapi

The entities that hold a legal rights for patent applications filed by inventor Kasapi Steven:

CREDENCE SYSTEMS CORPORATION 14 Milpitas, CA United States
DCG SYSTEMS, INC. 9 Fremont, CA United States
Credence Systems Coporation 1 Milpitas, CA United States
FEI EFA, Inc. 1 Fremont, CA United States

Recent patent applications by Kasapi Steven

Steven Kasapi from San Francisco, US has applied for patents for these inventions. The list has both pending applications and granted patents:

#1 | 2016-05-12

US20160131703A1

Physics

System and method for modulation mapping

#2 | 2013-05-09

US20130113510A1

Physics

System and method for modulation mapping

#3 | 2011-08-18

US20110199110A1

Physics

System and method for modulation mapping

#4 | 2010-02-18

US20100039131A1

Physics

System and method for modulation mapping

#5 | 2007-10-11

US20070236206A1

Physics

System and method for voltage noise and jitter measurement using time-resolved emission

#6 | 2007-03-01

US20070046301A1

Physics

System and method for modulation mapping

#7 | 2007-01-04

US20070002329A1

Physics

Apparatus and method for probing integrated circuits using laser illumination

#8 | 2007-01-04

US20070002328A1

Physics

Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system

#9 | 2006-08-17

US20060181268A1

Physics

Apparatus and method for detecting photon emissions from transistors

#10 | 2006-05-25

US20060108997A1

Physics

Apparatus and method for detecting photon emissions from transistors

#11 | 2006-05-18

US20060103378A1

Physics

Apparatus and method for dynamic diagnostic testing of integrated circuits

#12 | 2006-02-09

US20060031036A1

Physics

Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits

#13 | 2005-12-13

US10341721

Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits

#14 | 2005-11-01

US10379950

Universal diagnostic platform for specimen analysis

#15 | 2005-10-18

US10408988

System and method for calibration of testing equipment using device photoemission

#16 | 2005-08-11

US20050174248A1

Physics

Apparatus and method for determining voltage using optical observation

#17 | 2005-07-07

US20050146321A1

Physics

Apparatus and method for detecting photon emissions from transistors

#18 | 2005-06-16

US20050128471A1

Physics

Optical coupling for testing integrated circuits

#19 | 2005-05-26

US20050110893A1

Physics

Knife edge tracking system and method

#20 | 2005-05-10

US10234231

Apparatus and method for detecting photon emissions from transistors

#21 | 2005-02-22

US10229181

Apparatus and method for dynamic diagnostic testing of integrated circuits

#22 | 2005-01-06

US20050002028A1

Physics

Time resolved emission spectral analysis system

InventorID:

231428 ⎘